Titel:	Advances in Structural LEED Analyses of Silicon Surfaces
Autor(en):	Bahlmann, Jascha
Erstgutachter:	Prof. Dr. Joachim Wollschläger
Zweitgutachter:	Prof. Dr. Simone Sanna
Zusammenfassung:	Low-energy electron diffraction (LEED) is one possible experimental approach to determine atomic positions within the surface of crystalline surfaces. In this thesis, structural LEED analyses for the clean Si(001) surface as well as the Si(111)-(5 × 2)-Au reconstruction were performed. Additionally, the validity of the use of elastic strain energy as proposed by Keating was shown to improve the starting position for a structural analysis of covalent crystalline surfaces by LEED. Furthermore, an alternative approach to calculate the multiple scattering within the dynamical scattering theory was proposed. Thereby, LEED analyses of very large reconstructions and vicinal surfaces could become feasible.
URL:	https://doi.org/10.48693/216 https://osnadocs.ub.uni-osnabrueck.de/handle/ds-202212097918
Schlagworte:	electron diffraction; silicon; structural analysis; dynamical scattering theory; silicide; LEED
Erscheinungsdatum:	9-Dez-2022
Lizenzbezeichnung:	Attribution 3.0 Germany
URL der Lizenz:	http://creativecommons.org/licenses/by/3.0/de/
Publikationstyp:	Dissertation oder Habilitation [doctoralThesis]
Enthalten in den Sammlungen:	FB06 - E-Dissertationen

Diese Ressource wurde unter folgender Copyright-Bestimmung veröffentlicht: Lizenz von Creative Commons