Advances in Structural LEED Analyses of Silicon Surfaces

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Title: Advances in Structural LEED Analyses of Silicon Surfaces
Authors: Bahlmann, Jascha
Thesis advisor: Prof. Dr. Joachim Wollschläger
Thesis referee: Prof. Dr. Simone Sanna
Abstract: Low-energy electron diffraction (LEED) is one possible experimental approach to determine atomic positions within the surface of crystalline surfaces. In this thesis, structural LEED analyses for the clean Si(001) surface as well as the Si(111)-(5 × 2)-Au reconstruction were performed. Additionally, the validity of the use of elastic strain energy as proposed by Keating was shown to improve the starting position for a structural analysis of covalent crystalline surfaces by LEED. Furthermore, an alternative approach to calculate the multiple scattering within the dynamical scattering theory was proposed. Thereby, LEED analyses of very large reconstructions and vicinal surfaces could become feasible.
Subject Keywords: electron diffraction; silicon; structural analysis; dynamical scattering theory; silicide; LEED
Issue Date: 9-Dec-2022
License name: Attribution 3.0 Germany
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Type of publication: Dissertation oder Habilitation [doctoralThesis]
Appears in Collections:FB06 - E-Dissertationen

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